feature of low temperature testing chamber

low temperature testing chamberdoes not need to use the liquid gas (LN2LCO2) as an assistant means to lower the temperature. Its test method with the specimen under static state completely is presently used for the test and research of electronic products as well as for the large selection of semiconductor production lines, which can largely save the test expense for the consumptive materials. It is of fast operation and high reliability. It is the high performance test machine researched and developed by our company with great concentration and full effort for many years, which can provide you with the long-term and reliable test tool.

Conformity to standards of low temperature testing chamber

1. GB/T2423.1-1989

2. GB/T2423.2-1989

3. GB/T2423.22-1989

4. GJB150.5-86

5. GJB360.7-87

6. GJB367.2-87 405

7. SJ/T10187-91Y73

8. SJ/T10186-91Y73

9. IEC68-2-14    

10. GB/T 2424.13-2002

11. GB/T 2423.22-2002

12. QC/T17-92 

13. EIA 364-32

Control way and feature of  low temperature testing chamber

Use the high & low temperature thermal & cool storage tanks and need to open the DAMPER according to action so as to realize the quick shock effect; the balance temperature control system (BTC) controls the SSR in the P.I.D. way, which keeps the heating of the system equal to the heat loss, therefore, it can be used stably for a long time.